Optical Fork Sensor WFS3-40P415 Infrared Detection IP65 Rated SICK
The Optical Fork Sensor WFS3-40P415 is designed for precise label detection in packaging and printing industries.
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- Supply voltage: 10 V DC to 30 V DC
- Current consumption: 20 mA
- Switching frequency: 10 kHz
- Response time: ≤ 50 µs
- Switching output: PNP, max output current 100 mA
- Adjustment: Plus/minus button and cable teach-in for sensitivity and switching mode
- Enclosure rating: IP65
- Housing material: Glass-fiber reinforced PA
- Connection type: Male M8, 4-pin connector
- Ambient operating temperature: -20 °C to +60 °C
- Storage temperature: -30 °C to +80 °C
- Ambient light immunity: ≤ 10,000 lx
- Shock load: According to EN 60068-2-27
- Protection class: III
- Dimensions (H x L x W): 25mm x 64.3mm x 10mm
- Weight: 0.1 kg
- Optical detection principle with infrared LED light source
- Fork width of 3 mm and fork depth of 42 mm for precise label detection
- Minimum detectable object size of 2 mm gap between labels
- 2-point teach-in and dynamic teach-in modes for easy adjustment
- Light/dark switching mode with PNP switching output
- High switching frequency of 10 kHz and fast response time ≤ 50 µs
- IP65 rated enclosure for protection against dust and water
- Reverse polarity and short-circuit protected circuitry
- Installation by a qualified technician or electrician is recommended to ensure proper setup and compliance with electrical standards.
- Label detection in packaging and printing industries
- Object detection in automation and manufacturing processes
- Industrial automation requiring precise optical sensing
- AS/NZS 3000 – Wiring Rules (Electrical Installation)
- Energy-efficient LED infrared light source reduces power consumption
- Durable glass-fiber reinforced PA housing extends product lifespan, reducing waste
Standard manufacturer warranty applies; please refer to SICK's official warranty policy.
The SICK WFS3-40P415 Optical Fork Sensor is available for immediate purchase, ideal for industrial automation and label detection applications.
